Product Profile of Bit Error Rate Tester
Bit Error Rate Tester enables compliant testing and accurate Eye Pattern Analysis for high-speed serial and communication system standards. The Tester is a fast, effective method for determining long pattern jitter composition with triangulation. The Tester provides a quick understanding of signal integrity. The Bit Error Rate Tester comes with integrated stress generator for stressed eye sensitivity.
Key Features of Bit Error Rate Tester
- Enables compliant testing and accurate eye pattern analysis for high-speed serial and communication system standards.
- Fast, effective method for determining long pattern jitter composition with triangulation.
- Provides a quick understanding of signal integrity.
- Comes with integrated stress generator for stressed eye sensitivity.
- A test signal data rate, applied stress, and data pattern can be changed on the fly, independent of each other; enabling a diverse set of signal variations for testing chipset/system sensitivity.
